Langer RF-R 50-1
Sonde de champ proche - H-Field RF - 30MHz à 3GHz
RF-R 50-1
H-Field Probe 30 MHz up to 3 GHz
The RF-R 50-1 H-field probe is designed for measurements at assemblies, devices, or cables at distances up to approx. 3 cm. The H-field probe can identify larger components as interference sources.
The RF-R 50-1 is a passive near-field probe. Due to its medium size diameter (10 mm) it covers less of the magnetic field and is, therefore, less sensitive in comparision to the RF-R 400-1 probe. The RF-R 50-1 probe has a higher resolution than RF-R 400-1. In contrast to the H-field probe RF-R 3-2, the RF-R 400-1 covers more of the magnetic field and is more sensitive. As a result it has a lower resolution.
It has a current attenuating sheath and, is therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ohms input. The H-field probe does not have an internal terminating resistance of 50 Ohms.
H-Field Probe 30 MHz up to 3 GHz
The RF-R 50-1 H-field probe is designed for measurements at assemblies, devices, or cables at distances up to approx. 3 cm. The H-field probe can identify larger components as interference sources.
The RF-R 50-1 is a passive near-field probe. Due to its medium size diameter (10 mm) it covers less of the magnetic field and is, therefore, less sensitive in comparision to the RF-R 400-1 probe. The RF-R 50-1 probe has a higher resolution than RF-R 400-1. In contrast to the H-field probe RF-R 3-2, the RF-R 400-1 covers more of the magnetic field and is more sensitive. As a result it has a lower resolution.
It has a current attenuating sheath and, is therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ohms input. The H-field probe does not have an internal terminating resistance of 50 Ohms.
Details
RF-R 50-1
H-Field Probe 30 MHz up to 3 GHz
The RF-R 50-1 H-field probe is designed for measurements at assemblies, devices, or cables at distances up to approx. 3 cm. The H-field probe can identify larger components as interference sources.
The RF-R 50-1 is a passive near-field probe. Due to its medium size diameter (10 mm) it covers less of the magnetic field and is, therefore, less sensitive in comparision to the RF-R 400-1 probe. The RF-R 50-1 probe has a higher resolution than RF-R 400-1. In contrast to the H-field probe RF-R 3-2, the RF-R 400-1 covers more of the magnetic field and is more sensitive. As a result it has a lower resolution.
It has a current attenuating sheath and, is therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.
Technical parameters
| Frequency range | 30 MHz ... 3 GHz |
| Probe head dimensions | Ø ≈ 10 mm |
| Connector - output | SMB, male, jack |
| Frequency response [dBµV] / [dBµA/m] | ![Frequency response [dBµV] / [dBµA/m]](https://www.langer-emv.de/fileadmin/Bilder300/Disturbance%20emission_near%20field%20probe_RF-R%2050_frequency%20response_en_wPZ.png?v=1618988436185) |
| H-field correction curve [dBµA/m] / [dBµV] | ![H-field correction curve [dBµA/m] / [dBµV]](https://www.langer-emv.de/fileadmin/Bilder300/Disturbance%20emission_near%20field%20probe_RF-R%2050_H-field%20correction%20curve_en_wPZ.png?v=1618988436185) |
| Current correction curve [dBµA] / [dBµV] | ![Current correction curve [dBµA] / [dBµV]](https://www.langer-emv.de/fileadmin/Bilder300/Disturbance%20emission_near%20field%20probe_RF-R%2050_current%20correction%20curve_en_wPZ.png?v=1618988436185) |
| Measuring principles |  |
Product Details
| En Stock | Yes |
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