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Langer XF-R 400-1

Sonde de champ proche - H-Field XF - 30MHz à 6GHz

Reference : LANXF-R400-1
Purchase Order Reference : XF-R 400-1
Brand : Langer
XF-R 400-1
H-Field Probe 30 MHz up to 6 GHz 

Due to its large diameter (25 mm) and its high resolution, the XF-R 400-1 H-field probe is suitable for measurements at distances up to 10 cm around assemblies and devices.
The XF-R 400-1 is a passive near-field probe. In principle it has the same structure as the XF-R 100-1 and XF-R 3-2 probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 ? input. The H-field probe has an internal terminating resistance. 
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XF-R 400-1

H-Field Probe 30 MHz up to 6 GHz

  

Due to its large diameter (25 mm) and its high resolution, the XF-R 400-1 H-field probe is suitable for measurements at distances up to 10 cm around assemblies and devices.

The XF-R 400-1 is a passive near-field probe. In principle it has the same structure as the XF-R 100-1 and XF-R 3-2 probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.

 

Technical parameters

Frequency range 30 MHz ... 6 GHz
Probe head dimensions Ø ≈ 25 mm
Connector - output SMA, female, jack
Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m]
H-field correction curve [dBµA/m] / [dBµV] H-field correction curve [dBµA/m] / [dBµV]
Current correction curve [dBµA] / [dBµV] Current correction curve [dBµA] / [dBµV]
Measuring principles Measuring principles

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